
TDA5051A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 13 January 2011 20 of 29
NXP Semiconductors
TDA5051A
Home automation modem
13. Test information
Fig 21. Test set-up for measuring demodulation delay
(1) Square wave TTL signal 300 Hz, duty factor = 50 % for measuring signal bandwidth
(see Figure 3
).
(2) DATA_IN
+ LOW for measuring total harmonic distortion (see Figure 3).
(3) Tuned for f
cr
= 132.5 kHz.
(4) The CISPR16 network provides a −6 dB attenuation.
Fig 22. Test set-up for measuring THD and bandwidth of the TX_OUT signal
30 Ω
1 μF
10 nF
XTAL
DATA_IN
DATA_OUT
t
d(dem)(su)
t
d(dem)(h)
DATA_OUT
DATA_IN
TX_OUT/RX_IN
OSCILLOSCOPE
Y1
TDA5051A
(to be tested)
pulse
generator
300 Hz
50 %
Y2
TX_OUT
RX_IN
f
osc
2
1
10
14
78
002aaf051
G
002aaf05
TDA5051A
POWER
SUPPLY
SPECTRUM
ANALYZER
50 Ω
10
7
8
OSC1
OSC2
12, 5, 9
1 13, 3, 11
TX_OUT
AGND, DGND, APGND
V
DDA
, V
DDD
, V
DDAP
5 Ω
50 Ω
10 μF
33 nF
250 nF
47 μH
50 μH
33 nF
47 μH
coupling network
(3)
CISPR16 network
(4)
+5 V
(2)(1)
DATA_IN
G
250 nF
5 Ω
50 μH
002aaf05
TDA5051A
POWER
SUPPLY
SPECTRUM
ANALYZER
50 Ω
10
7
8
OSC1
OSC2
12, 5, 9
1 13, 3, 11
TX_OUT
AGND, DGND, APGND
V
DDA
, V
DDD
, V
DDAP
5 Ω
50 Ω
10 μF
33 nF
250 nF
47 μH
50 μH
33 nF
47 μH
coupling network
(3)
CISPR16 network
(4)
+5 V
(2)(1)
DATA_IN
G
250 nF
5 Ω
50 μH
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